Variability-Aware Static Latch Modeling
نویسندگان
چکیده
In this paper we study the impact of variability on the transmission gate based latch. The threshold voltage (Vt) fluctuation due to Random Dopant Fluctuation (RDF) and Process, Voltage, and Temperature (PVT) effects to propagation delay, as well as subthreshold leakage and probability of failure are discussed. We propose a modeling methodology which is not tied to a specific topology such as Monte Carlo simulation. To generate failure analysis, we sampled the probability domain and reconstructed the probability density function.
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تاریخ انتشار 2013